Next Article in Journal
CMOS-MEMS Test-Key for Extracting Wafer-Level Mechanical Properties
Previous Article in Journal
Improved Membrane-Based Sensor Network for Reliable Gas Monitoring in the Subsurface
 
 
Article

Article Versions Notes

Sensors 2012, 12(12), 17074-17093; https://doi.org/10.3390/s121217074
Action Date Notes Link
article xml file uploaded 25 January 2013 15:31 CET Original file https://www.mdpi.com/1424-8220/12/12/17074/xml
article html file updated 25 January 2013 15:31 CET Original file -
article html file updated 7 February 2013 17:22 CET Update -
Correction published 22 April 2013 00:00 CEST Correction https://www.mdpi.com/1424-8220/13/4/5404
article supplementary file uploaded. 22 April 2013 14:05 CEST - https://www.mdpi.com/1424-8220/12/12/17074#supplementary
article html file updated 17 June 2015 04:45 CEST Update https://www.mdpi.com/1424-8220/12/12/17074/html
Back to TopTop