Design and Applications of Coordinate Measuring Machines

doi:10.3390/books978-3-03842-277-8

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Keywords

touch-trigger probe; stiffness; quadrant photo detector; coordinate measuring machine; micro coordinate measuring machine; Abbe error free; three dimensional measurement; on-machine; turning; dimension error; auto-inspection; tool wear; auto-compensation; Coordinate Measuring Machines (CMM); five-axis system; accuracy modeling; Monte Carlo method; probe head; virtual model; surface force; van der Waals force; electrostatic force; liquid bridge force; microstructure; measurement; optical fiber probe; laser diode; coordinate measuring machine (CMM); micro coordinate metrology; tactile probe; calibration; performance verification; measurement; micro-probe; on-line qualification; gauge block; uncertainty; metrology; slot die coater; coordinate metrology; Monte Carlo method; uncertainty; copulas theory; metrological traceability; portable articulated coordinate measuring machine; generalized geometric error parameters; sample strategy; Levenberg-Marquard algorithm; micro-EDM; micro spherical stylus tip; micro-CMM; micro-coordinate measuring machine (micro-CMM); 3D coordinate metrology; microparts; traceability; calibration; CMM probe; physical standards; microhole; microgear; contour

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Design and Applications of Coordinate Measuring Machines

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November 2016

210 pages

ISBN978-3-03842-276-1 (Hardback)
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https://doi.org/10.3390/books978-3-03842-277-8

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This is a Reprint of the Special Issue Design and Applications of Coordinate Measuring Machines that was published in

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