Advanced Microwave Sensing and Imaging in Real-Time for High-Resolution Industrial Applications

Dear Colleagues,

The development of advanced microwave sensing and imaging has transformed industrial applications by enabling real-time, high-resolution capabilities. This cutting-edge technology combines the capability of microwave detection with real-time processing, creating a dynamic tool for businesses. Unlike conventional approaches, this innovative solution enables rapid data capture and analysis, allowing enterprises to make educated decisions promptly. The accuracy of data is of utmost importance in high-resolution industrial applications. Advanced microwave sensing guarantees that details are collected, providing a thorough understanding of processes, materials, and surroundings. The real-time nature of this technology becomes extremely important when it comes to monitoring production lines, examining crucial components, or assuring the quality of materials. The capacity to rapidly recognize anomalies or variations from standard parameters boosts efficiency and decreases downtime. Moreover, the high-resolution imaging capacity permits extensive examinations, helping spot possible concerns before they escalate. Industries derive advantages from the implementation of better-quality control measures, predictive maintenance techniques, and heightened safety regulations. The system's ability to operate in real-time is essential in dynamic industrial environments since it provides a necessary level of reactivity. Antenna sensors, multiple-input multiple-output (MIMO), resonant and non-resonant approaches, metasurface, complementary metamaterial, and many more technologies and techniques are all part of advanced microwave sensing, which brings a wide array of capabilities to the field.

We invite authors with both industrial and scientific backgrounds, working in any area of microwave sensing and applications, to submit their original manuscripts for consideration to this Special Issue. Specific areas of interest include, but are not limited to, the following:

1. Antenna sensors;
2. MIMO systems;
3. Non-destructive testing (NDT);
4. Metasurface;
5. Dielectric characterization;
6. Microwave measurements and system design;
7. Microwave sources and detectors;
8. Imaging in real time;
9. Metamaterial and complementary metamaterial;
10. Industrial applications;
11. Rapid prototyping;
12. Resonant and non-resonant approaches.

Dr. Tanveer Ul Haq
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• antenna sensors
• MIMO systems
• non-destructive testing (NDT)
• metasurface
• dielectric characterization
• microwave measurements and system design
• microwave sources and detectors
• imaging in real time
• metamaterial and complementary metamaterial
• industrial applications
• rapid prototyping
• resonant and non-resonant approaches