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Journal: Sensors, 2020
Volume: 20
Number: 2670

Article: A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging
Authors: by Zipeng Xie, Yongjie Li, Liguo Sun, Wentao Wu, Rui Cao and Xiaohui Tao
Link: https://www.mdpi.com/1424-8220/20/9/2670

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