Reprint

Structure and Phase Transformations in Thin Films

Edited by
September 2023
142 pages
  • ISBN978-3-0365-8734-9 (Hardback)
  • ISBN978-3-0365-8735-6 (PDF)

This book is a reprint of the Special Issue Structure and Phase Transformations in Thin Films that was published in

Chemistry & Materials Science
Engineering
Summary

The field of thin films has undergone significant developments in recent decades. Besides the multiple applications of thin films, increasing competence can be observed with regard to tailoring the film microstructure using composition and deposition parameters. This Special Issue contains cutting-edge research and review articles regarding the preparation and characterization of materials with excellent properties, as well as the related modelling approaches. The papers published in this Special Issue cover a wide range of topics, including high-entropy alloys, hard materials, effects of additives on structures and properties, and the identification of Magnéli phases. Computer modelling of magnetic properties and optical modelling of dielectric function are also represented in this volume. The reader can find strong indications of the importance of extending existing knowledge through the exploration of the mechanisms of the ongoing processes via in situ monitoring.

Format
  • Hardback
License and Copyright
© 2022 by the authors; CC BY-NC-ND license
Keywords
high entropy alloy; in-situ TEM annealing; thermal stability; diffusionless transformation; planar disorder; oxide formation; Ni–Mo films; micropillar compression; strain-softening; twins; detwinning; germanium; optical properties; dielectric function; thin film characterization; semiconductor; spectroscopic ellipsometry; optical dispersion; Tauc-Lorentz model; Cody-Lorentz model; sputter deposition; thin films; X-ray diffraction; expanded austenite; SiNx:H; refractive index; activation energy; structure; isothermal entropy; Néel phase transition temperature; synthetic nanomaterials; Fe2O3 thin films; the Monte-Carlo method; ferromagnetic; magnetoelastic; phase transition; thin films; Frenkel–Kontorova potential; TixZr1−xN hard film; Zr/(Zr+Ti) molar ratio; phase structure; preferred growth orientation; hardness; V4O7; Magnéli phases; vanadium oxides; thin films; Raman scattering; phase transitions; Rutherford backscatter spectrometry; AlCrTiN hard films; multi-arc ion plating; TiN/CrN molar ratio; hardness; phase composition; thermal shock cycle; n/a