Reprint
Phase-Contrast and Dark-Field Imaging
Edited by
December 2018
146 pages
- ISBN978-3-03897-284-6 (Paperback)
- ISBN978-3-03897-285-3 (PDF)
This is a Reprint of the Special Issue Phase-Contrast and Dark-Field Imaging that was published in
Computer Science & Mathematics
Engineering
Physical Sciences
Summary
The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
Format
- Paperback
License and Copyright
© 2019 by the authors; CC BY-NC-ND license
Keywords
archaeological findings; non-destructive materials testing; X-ray phase-contrast imaging; Talbot-Lau interferometry; directional dark-field imaging; sub-pixel fibre orientation; organic remnants; fabric remnants; X-ray speckle-based imaging; X-ray near-field speckle; X-ray phase-contrast imaging; X-ray dark-field imaging; X-ray multimodal imaging; X-ray phase tomography; X-ray wavefront sensing; metrology; optics characterisation; X-ray imaging; phase-contrast; Talbot–Lau; image reconstruction; spectrum analysis; fringe analysis; moiré imaging; X-ray imaging; phase contrast; speckle; multi-contrast; tomography; chip; cement; X-ray imaging; phase-contrast imaging; dark-field imaging; X-ray imaging; Talbot–Lau interferometer; grating interferometer; phase contrast imaging; darkfield imaging; phase stepping; optimization; enamel caries; small-angle X-ray scattering; image registration; bivariate histogram plot; segmentation; multi-modal imaging; dark-field (DF); electron channeling contrast imaging (ECCI); electron channeling pattern (ECP); electron backscatter diffraction (EBSD); deformation; scanning electron microscope (SEM); transmission kikuchi diffraction (TKD; t-EFSD; t-EBSD); X-ray phase-contrast imaging; X-ray scattering; dark-field imaging; Computed Tomography; Talbot-interferometer; coded-aperture imaging; Moiré pattern analysis; Electron Backscatter imaging; cultural heritage; medical imaging; image processing; fourier image analysis