*2.13. X-ray Diffraction*

The XRD patterns were obtained using a X-ray diffractometer (PANalytical Model X'pert PRO, Royston, UK). Film samples with dimensions of 4.0 cm × 1.5 cm were cut and fixed in a circular clamp of the instrument. The analysis was carried out directly and the conditions were as follows: (i) voltage and current: 40 kV and 40 mA, respectively; (ii) scan range from 3◦ to 30◦; (iii) step: 0.1◦ and (iv) speed 1◦/min, equipped with a secondary monochromator of graphite beam. The samples were stored at 25 ◦C and 50% Relative humidity (RH) and analyzed in triplicate.
