*2.5. Morphology*

The morphology of the electrospun mats was examined by scanning electron microscopy (SEM) with a S-4800 from Hitachi (Tokyo, Japan). Prior to examination, samples were deposited on suitable beveled microscopy holders and sputtered using a gold-palladium mixture under vacuum. All SEM experiments were carried out at 8.0 kV.

Transmission electron microscopy (TEM) was performed using a JEOL 1010 from JEOL USA, Inc. (Peabody, MA, USA) equipped with a digital image acquisition system from Bioscan (Edmonds, WA, USA). TEM images were taken directly on mats electrospun onto the TEM observation grids. At least 25 SEM and TEM micrographs were analyzed for each sample using Adobe Photoshop 7.0 software from Adobe Systems Incorporated (San Jose, CA, USA) to determine the sizes from their original magnification.

#### *2.6. Wide Angle X-ray Scattering*

Wide angle X-ray scattering (WAXS) was performed using a D5000 X-ray Powder Diffractometer from Siemens AG (Munich, Germany). Radial scans of intensity vs. scattering angle (2θ) were recorded at room temperature in the range 2 to 50◦ (2θ), step size of 0.03◦ (2θ), scanning rate of 8 s/step, with identical settings of the instrument by using a filtered Cu Kα radiation (λ = 1.5406 Å), an operating voltage of 40 kV, and a filament current of 30 mA. Bragg's law (n·λ = 2·*d*·sinθ) was applied to calculate the basal spacing (*d*).
