*2.2. Characterization*

### 2.2.1. X-ray Diffraction (XRD)

The crystal structural analyses of LSC were determined by XRD measurements (Rigaku, D/max-2500/PC) from 20◦ to 90◦.

### 2.2.2. Scanning Electron Microscopy (SEM)

The morphology of the nanoparticles was observed with a field emission SEM (FEI·Nova·Nano·SEM450) at a 5 kV accelerating voltage. Dispersion of the nanoparticles in the semiconductive composites was observed using SEM (JSM-6700F, JEOL, Tokyo, Japan). The nanocomposites were broken in liquid nitrogen and then fractured cross-sections were sprayed with gold to avoid the charge accumulation effect during observation.

### 2.2.3. Transmission Electron Microscopy (TEM)

In order to characterize the dispersion of the LSC in the matrix polymer, 50–100 nm thick ultra-thin sections were cut using a ultramicrotome and observed using a TEM (FEI·Tecnai·G2F30).
