*4.3. AFM Data Analysis*

The resulting force curves were then processed by means of both the JPK-Data Processed software (JPK Instruments, Berlin, Germany) and MATLAB custom-written software. The contour length (LC) of each peak (both I27 and AS) was calculated by means of WLC fit as a single parameter, while the persistence length (LP) was kept constant (0.36 nm) [59]. Only curves with a single clear detachment peak, at least seven I27 peaks, and traces with a spurious signal below 45pN in the first 25 nm of the force-extension were considered.
