*2.3. Single-Crystal X-ray Di*ff*raction and Crystal Structure Determination*

Single-crystal X-ray diffraction data were collected by means of an Xcalibur S CCD diffractometer (Dept. of Crystallography and Crystal Chemistry, Faculty of Geology, Moscow State University) operated at 40 kV and 50 mA using Mo*K*α radiation. A full sphere of three-dimensional data was collected. Data reduction was performed using CrysAlisPro Version 1.171.37.35 [9]. The data were corrected for Lorentz factor and polarization effects. The crystal structure was solved and refined with the ShelX program package using direct methods [10].
