2.5.3. X-ray Diffraction (XRD)

X-ray diffraction (XRD) analysis of the NC samples were determined with a D8 X-ray diffractometer (Bruker-AXS, Karlsruhe, Germany) equipped with a copper target (λ = 0.15406 nm) at 30 mA and 40 kV. Data were recorded in the range (2θ) of 5–40◦ at a scan rate of 0.02◦·s–1. The crystallinity index was calculated with Equation (2):

$$\text{CrI} = \frac{I\_{200} - I\_{\text{amr}}}{I\_{200}} \tag{2}$$

where *CrI* is the crystallinity index, *I*<sup>200</sup> is the maximum intensity of the diffraction from the 200 plane, and *Iam* is the intensity of particles scattered by the amorphous part of the sample.
