Atomic Force Microscopy (AFM)

AFM of NOCNF was performed using a Bruker Dimension ICON scanning probe microscope (Bruker Corporation, Billerica, MA, USA) equipped with a Bruker OTESPA tip (tip radius (max.) = 10 nm). In this measurement, a 10 μL of 0.005 wt. % NOCNF suspension was deposited on the surface of a silica plate, where the air-dried sample was measured in the tapping mode.
