Scanning Electron Microscopy (SEM)

A Zeiss LEO 1550 SFEG-SEM instrument (White Plains NY, USA) was used to record SEM images of the samples. The instrument was comprised of an in-lens secondary electron detector in addition to the standard E-T detector, and a Rutherford backscatter electron detector. It was also equipped with an EDS (energy dispersive X-ray spectroscopy) system, provides elemental compositions and X-ray maps of the various phases of the materials examined. Images of surface morphology of NRL and NRL composite films were taken to observe the NRL film surface change on addition of NOCNF.
