2.3.5. Atomic Force Microscopy

Atomic force microscopy (AFM) micrographs of pristine and cationic CNCs were obtained using a Nanoscope IV (Digital Instruments Veeco, Santa Barbara, CA, USA) with a silicon tip operated in tapping mode. Particle analysis of the micrographs was performed using the software Scanning Probe Image ProcessorTM (5.0.8.0; Image Metrology, DK-2800 Lyngby, Denmark)
