2.4.5. Scanning Electron Microscopy Analysis (SEM)

SEM micrographs were acquired by FE-SEM LEO 1525 ZEISS (Carl Zeiss Microscopy, Jena, Germany). The samples were prepared by deposition of the sample on conductive carbon adhesive tape and then metalized with chromium (8 nm) by sputtering. Elemental mapping was determined by energy dispersive X-ray analysis (EDX, Bruker Quantax, Billerica, MA, USA).
