2.4.5. X-ray Diffraction Peak Profile Analysis (XPA)

Selected samples were subjected to X-ray diffraction peak profile analysis (XPA) measurements by means of a self-assembled double diffractometer to measure dislocation density ρ. The X-ray source was a MM9 X-ray rotating anode generator (RIGAKU, Tokyo, Japan) using monochromatic Co-Kα radiation, corresponding to a wavelength λ = 1.79 nm. The peak profiles were collected by a curved position-sensitive detector of type CPS-590 (INEL, Artenay, France), covering an angular range of 90◦ between 40◦ and 130◦. For details of the diffraction theory of Bragg peak broadening related to dislocation density and crystallite size, see [39,40]. The evaluation of XPA data was done by the open source software (C) MWP-fit (Version 140518, Budapest, Hungary) [41,42].
