*2.3. Characterization Techniques*

### 2.3.1. Powder X-Ray Diffraction Analysis (PXRD)

The solid phases resulting from the NTZ cocrystal synthesis and the samples recovered from the powder dissolution experiments were examined by PXRD analysis using a BRUKER D8-ADVANCE diffractometer (Bruker, Bremen, Germany) equipped with a LynxEye detector (λCu*K*α<sup>1</sup> = 1.5406 Å, monochromator: germanium). The equipment was operated at 40 kV and 40 mA, and data were collected at room temperature in the range of 2θ = 5–45◦. Powder diffraction patterns were compared with the simulated patterns from single crystal X-ray diffraction (SCXRD) data.

### 2.3.2. Scanning Electron Microscopy (SEM) Analysis

The solid residuals obtained after the dissolution tests under sink conditions were analyzed by SEM. For this purpose, the samples were coated with a gold layer, where after SEM micrographs were captured by a VEGA 3 TESCAN scanning electron microscope (Tescan Orsay Holdings, Kohoutovice, Czech Republic) at 10.0 kV.
