2.2.10. Morphological Analysis

A Zeiss Supra variable Pressure Field Emission Scanning Electron Microscope (SEM, Ulm, Germany) equipped with a secondary electron detector and an accelerating voltage of 5 kV was used for the morphological examination. The produced powder samples were placed on carbon tabs attached to aluminum stubs and sputter coated with gold/palladium under vacuum before analysis [10].
