2.3.4. Powder X-ray Di ffraction (PXRD)

X-ray powder di ffraction patterns were collected using a Bruker D8 Discover di ffractometer (Bruker, Billerica, MA, USA) equipped with a proportional counter, Cu-K α radiation of λ = 1.5405 Å and a nickel filter. Samples were placed onto a silicon wafer slide. Generator settings were 30 kV with a current of 40 mA used for the measurement. Data were collected (*n* = 3) in the range 2θ = 10◦ to 50◦ at a scanning rate of 1.5◦ min−<sup>1</sup> with a filter time-constant of 0.38 s per step and a slit width of 6.0 mm. The X-ray di ffraction data were treated using evaluation curve fitting (Di ffrac.Eva, version: V2.9.0.22, Bruker) software. Baseline correction was performed on each di ffraction pattern by subtracting a spline function fitted to the curved background and the di ffraction pattern of uncoated nano co-crystals was used for reference purposes.
