2.3.3. Scanning Electron Microscopy (SEM)

Using an Ultra plus electron microscope from Carl Zeiss NTS GmbH, Oberkochen, Germany (3 kV, 30 μm aperture size, and SE2 detector), scanning electron microscope images of the silica-elastomer composites were recorded. Strip samples of these elastomer composites were broken after being exposed to liquid nitrogen. The respective fracture surface was then sputtered with 3-nm platinum with the BAL-TEC SCD 500 Sputter Coater and investigated under SEM at a zero angle.
