**Challenges and New Trends in Power Electronic Devices Reliability**

Editors

**Elio Chiodo Pasquale De Falco Luigi Pio Di Noia**

MDPI • Basel • Beijing • Wuhan • Barcelona • Belgrade • Manchester • Tokyo • Cluj • Tianjin


*Editorial Office* MDPI St. Alban-Anlage 66 4052 Basel, Switzerland

This is a reprint of articles from the Special Issue published online in the open access journal *Electronics* (ISSN 2079-9292) (available at: www.mdpi.com/journal/electronics/special issues/ devices reliability).

For citation purposes, cite each article independently as indicated on the article page online and as indicated below:

LastName, A.A.; LastName, B.B.; LastName, C.C. Article Title. *Journal Name* **Year**, *Volume Number*, Page Range.

**ISBN 978-3-0365-1177-1 (Hbk) ISBN 978-3-0365-1176-4 (PDF)**

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The book as a whole is distributed by MDPI under the terms and conditions of the Creative Commons license CC BY-NC-ND.
