*6.1. Experimental Setup*

The experiment was conducted at a trip setting of 4 A, where Iinput = 4000. The pickup (PU) time was defined as the time taken after the current reached the defined trip setting to the point that the gate drive control signal went from high to low. The total clearing time (TCT) was defined as the time taken for the current to stabilize within two percent of the zero value after reaching the rated trip setting, and the switching time (SWT) was the difference between the two measurements. The test bench and sensing equipment consisted of a Feedback 67–113 200-ohm variable-load resistor, KEYSIGHT AC6804A power supply, KEYSIGHT InfiniVision MSOX4104A oscilloscope, KEYSIGHT N7026A current probe, KEYSIGHT N2790A differential probe, KEYSIGHT N2790A passive probe, and Tektronix PWS2323 DC Power Supply. The AC6804A was used to provide the high-side voltage and current through the switch to the 200-ohm variable-load resistor. The PWS2323 DC power supply was used to power the low-side electronics. The KEYSIGHT oscilloscope and probes were used in all measurements. In total, 25 test inputs were formulated and randomized with varying current levels from 4 to 8 A, and the N7026A current probe was zeroed out at the start of each session. The MSOX4104A oscilloscope was then set to the plus or minus 100 μs range, and each waveform to be measured was set within the expected output levels. The trigger function was set to a negative slope, and the trigger point was set to 500 mA. The MEGA microcontroller was programmed to the designated trip setting, and the 67–113 variable resistor was set to the needed resistance determined by the current that would be delivered to the circuit. The oscilloscope was set to single-waveform capture and the voltage from the AC6804A power source was turned on. The switch was then activated, allowing current to flow through the circuit and the resulting trip was documented as follows.

Cursor Y1 was set to zero and Y2 was set to the trip setting amperage of 4 A, as shown in Figure 9. X1 was then set at the crossing point of Y2, and X2 was set at which the point microcontroller responded. The resulting PU measurement between X1 and X2 was recorded. X2 was then moved to the zero-crossing, as shown in Figure 10, and the resulting TCT measurement was recorded.

**Figure 9.** Trip setting measurement setup. Crossing point of cursors X1 and Y1.

**Figure 10.** Total clearing time measurement setup showing time between X1 and X2.

The SWT measurement was taken as the di fference between the PU and TCT measuring the propagation delay of the high-side driver and the switching action of the circuit. The process was repeated until all 25 inputs were completed. Channel 1 depicts the current (yellow), channel 2 depicts VCE as shown in Figure 4 (green), and channel 3 shows the logic control signal for the high-side switch from the microcontroller (blue).
