*3.2. Catalyst Characterization*

X-ray powder diffraction (XRD) patterns of these catalysts were measured by a Rigaku D/max2550VB3+/PC diffractometer (Rigaku International Corporation, Tokyo, Japan) using Cu K radiation at 40 KV and 40 mA. BET surface areas and average pore size of the catalysts were carried out by N2 adsorption at 77 K with a Micrometric ASAP 2020 apparatus (Micromeritics GmbH, Aachen, Germany). Before measurements, the samples were degassed at 150 for 12 h. Temperature programmed reduction (TPR) of the samples was done in a Micromeritics AutoChem II 2920 apparatus equipped with TCD (Micromeritics GmbH, Aachen, Germany). A 50 mg sample was heated from room temperature to 800 ◦C in 10% H2/90%N2. Scanning electron microscope (SEM) images were recorded using an FEI Quanta 200 instrument (FEI, Eindhoven, Netherlands). High-resolution transmission electron microscopy (HRTEM) images were recorded using a JEM-2100 TEM Field Emission Electron Microscope (JEOL GmbH, Freising, Germany).
