**Hongpeng Shang, Degui Sun, Peng Yu, Bin Wang, Ting Yu, Tiancheng Li and Huilin Jiang**

Investigation for Sidewall Roughness Caused Optical Scattering Loss of Silicon-on-Insulator Waveguides with Confocal Laser Scanning Microscopy Reprinted from: *Coatings* **2020**, *10*, 236, doi:10.3390/coatings10030236 ................ **109**
