*4.5. Isolation of Faults*

Through multiple simulations, it was found that *R*0 responds the fastest to current sensor faults, while either *R*1 or C1 responds the fastest to voltage sensor faults. From these findings, it is possible to establish a fault isolation schematic to complement the proposed fault detection method. It is uncertain whether these faults would have the same effects on a different type of cell, but this will be focused on and further validated in future studies. For this paper, the FDI scheme will be based on the

observations from the tested LFP cell. The full FDI scheme is shown in Figure 8. This scheme will be used to diagnose faults, and validated through simulation in the next section.

**Figure 8.** Proposed fault detection and isolation scheme.
