2.5.1. Solid-State Characterization

Crystallinity of encapsulated FEN was investigated using X-ray powder diffraction (XRPD) and differential scanning calorimetry (DSC) (TA instrument, Rydalmere, Australia). XRPD data was obtained using a Malvern Panalytical Empyrean XRPD (Malvern, UK). Samples were scanned between 5 ◦ and 90◦ (2θ) at a rate of 5 s/point and step size of 0.02◦ . For DSC analysis, samples were accurately weighed into aluminum pans and hermetically sealed with an aluminum lids and heated at a rate of 10 ◦C/min over a temperature range of 25–120 ◦C. XRPD and DSC measurements were taken 1 day after formulations were fabricated.
