*2.3. Microstructure Analysis*

The morphology and element analysis of the SnS/C materials before and after cycling was examined using a Hitachi S-4800 (Hitachi, Chiyoda City, Japan) field emission scanning electron microscope (FESEM) and a Philips CM200-FEG (Philips, Amsterdam, The Netherland) transmission electron microscope (TEM); both were equipped with electron dispersive spectroscopy (EDS). After cycling, the cells were opened in a fume hood and the working electrode was dipped in a 1:1 by volume mixture of ethylene carbonate (EC) and dimethyl carbonate (DMC) for 30 s to remove electrolyte residue, and was then dried using argon. Powders were then scraped onto (i) a piece of conductive carbon tape that was placed on a standard FESEM sample holder, and (ii) a TEM carbon lacy grid, which was then placed in the TEM. X-ray diffraction (XRD) was performed using a Philips X'Pert MPD diffractometer (Philips, Amsterdam, The Netherland).
