4.5.2. ATR-FT-IR Analysis of Flour

FT-IR spectra of the flours were collected in triplicate in the range of 650 to 4000 cm−<sup>1</sup> by using a Thermo Scientific Nicolet iS20 (Waltham, MA, USA) spectrometer, at a resolution of 8 cm−<sup>1</sup> by 64 scans. The fractions of amide I (1835–1585 cm−<sup>1</sup> ), polyphenols (1516–1747 cm−<sup>1</sup> ) and starch (800–1300 cm−<sup>1</sup> ) were identified, the data being processed with OMNIC software. The starch, polyphenols and protein structures were assessed according to previous studies [31,68–70]. Fourier deconvolution was applied in order to characterize starch and protein structures.

#### 4.5.3. Microstructure

Electronic scanning microscopy was employed for flour microstructure evaluation with a VEGA II LSH scanning electronic microscope (Tescan, Brno, Czech Republic). The acceleration tension was 30 kV and the magnification 1000×, the samples being fixed with adhesive carbon bands.

Pasta surface structure analysis was performed on a Mahr CWM100 microscope (Gottingen, Germany). The data collected were processed with Mountain Map trial version software (Digital Surf, Besançon, France).
