*2.7. Statistical Analysis*

XPS, SEM, and ToFSIMS data in this study are reported as the mean ± standard deviation value (where *N* = 3). For the SEM analysis of the surfaces produced, a one-way analysis of variance (ANOVA) was applied to test for statistically significant di fferences between the sample types with a value of *P* < 0.05 considered to be statistically significant. The Bonferroni multiple comparison test was applied to compare values between successive pairs of sample types with the relevant outputs reported. All statistical analysis was performed using GraphPad Prism Version 3.0 software.
