2.5.2. XRD

X-ray di ffraction was carried out with a Rigaku Ultima IV X-ray Di ffractometer (XRD) (RIGAKU AMERICAS CORPORATION, Woodland, TX, USA) using Cu-K α radiation at 40 kV and 40 mA. This was used for quantitative analysis and also to determine the various phases of the precipitates and the products obtain after NH4·HF addition.
