**About the Editors**

**Cristian Zambelli** received M.Sc. and the Ph.D. degrees in Electronic Engineering from the University of Ferrara, Ferrara, Italy, in 2008 and 2012, respectively. Since 2015, he has held an Assistant Professor position with the same institution. His current research interests include the electrical characterization, physics, and reliability modeling of different nonvolatile memories such as NAND/NOR Flash, Phase Change Memories, Nano-MEMS memories, Resistive RAM (RRAM), and Magnetic RAM. He is also interested in the evaluation of the Solid State Drive reliability/performance trade-offs exposed by the integrated memory technology.

**Rino Micheloni** is a Research Fellow at the University of Ferrara, Italy. Before that, he was Vice-President and Fellow at PMC/Microsemi/Microchip, where he established the Flash Signal Processing Labs in Milan, Italy, with special focus on NAND Flash technology characterization, Machine Learning techniques for improving memory reliability, and Error Correction Codes. Before that, he was with IDT Inc. as Lead Flash Technologist, driving the architecture and design of the BCH engine in the world's first PCIe NVMe SSD controller. Early in his career, he led NAND design teams at STMicroelectronics, Hynix, and Infineon; during this time, he developed the industry's first MLC NOR device with embedded ECC and the industry's first MLC NAND with embedded BCH. Dr. Micheloni is an IEEE Senior Member, he has co-authored 100+ publications and 10 books on non-volatile memories, and he holds 295 patents. In 2020 Dr. Micheloni was selected for the European Inventor Award.
