**About the Editors**

**Thomas Walter Cornelius**, Dr. rer. nat., is CNRS researcher (since 2011) at the Institute for Materials, Microelectronics and Nanoscience of Provence (IM2NP) in Marseille, France. His research focuses on the mechanical properties of nanostructures and the relationship between mechanical strain and physical properties of nanomaterials. For his research, he strongly uses synchrotron X-ray diffraction methods and develops in situ techniques. His previous academic positions were at the European Synchrotron ESRF (Grenoble, 2008-2011) and the Hemlholtz Center for Heavy Ion Research (Darmstadt, 2006-2008). He obtained a PhD in Physics (2006) and diploma degree (2003) from the Ruprecht-Karls University in Heidelberg.

**Souren Grigorian** completed his PhD in Physics at the Institute of Crystallography, Moscow in 2000. He has since held a variety of research positions at institutions across Europe and became senior scientist at the University of Siegen in 2010. As an internationally recognized researcher, he was offered the role of guest scientist at NIST, Gaithersburg, and invited professor at Aix-Marseille University as well as Sapienza University of Rome. Among his research interests are advanced X-ray techniques for investigating multifunctional soft materials, in situ studies of working organic devices, direct correlation of microstructures and optoelectronic properties, and flexible organic electronics. Outside of his research, Dr Habil Grigorian has actively participated in teaching on an international level, and has coordinated the Volkswagen Foundation's grants for the International Symposium and Young Scientist School over several years.
