*2.3. X-ray Diffraction*

A selection of samples was analyzed as fine ground powders. X-ray diffraction analyses were performed using a Rigaku Miniflex 300 diffractometer (30 kV, 10 mA, Cu-Kα radiation (λ = 1.5418 Å), 5–55◦ Theta/2-Theta, step scan 0.02◦, scan speed 3◦/min). PDXL2 software supporting ICDD (The International Centre for Diffraction Data) PDF2 databases were used to identify the phases.
