**4. Conclusions**

The paper presents a method for extracting the main parameters of wide-bandgap TCO thin films from the measured and recorded dynamic hot-probe characteristics and its theoretical foundations. The measurement technique is simple and inexpensive. Conventional measuring instruments equipped with simple software allow the recording and storage of measured data. The technique for extracting the main parameters has been tested on commercial ITO thin films. The results are consistent with the presented and reference data. Then, this method was used to study homemade thin films of AZO, which were prepared by the magnetron co-sputtering method. The parameters of these films such as the majority charge carrier type, concentration, and mobility were extracted from the dynamic hot-probe characteristics measured at different temperatures. The results obtained are in agreemen<sup>t</sup> with the literature data for thin AZO films. In addition, the proposed method can be used to calculate the bandgap and thermoelectric power of the films.

**Funding:** This research received no external funding.

**Institutional Review Board Statement:** No applicable.

**Informed Consent Statement:** Not applicable.

**Data Availability Statement:** Not applicable.

**Acknowledgments:** The authors acknowledge the Holon Institute of Technology for the possibility to provide this research.

**Conflicts of Interest:** The authors declare no conflict of interest.
