**4. Conclusions**

A 0.18-μm CMOS reprogrammable fuse using EEcells is proposed for trimming a digital temperature sensor. The fuse uses EEPROM memory cells, which allow multiple programming cycles by altering the stored data for digital trim codes applied to the smart sensor. By reprogramming the fuse, the digital sensor can be adjusted with an increased trim variation in order to achieve higher accuracy. The operation of the trimmed DTS was validated by Synopsis HSPICE simulations and wafer-level and encapsulated IC measurements. A +1.5/ −1.0 ◦C inaccuracy in the −20 to 125 ◦C range was obtained for 25 DTS measured samples at 1.8 V by one-point calibration, while the mean was centered at 0.44 ◦C, with a standard deviation of 0.71 ◦C. The digital sensor exhibits similar results for a power supply range of 1.7 to 3.6 V. Thus, the DTS's performance is in fairly good agreemen<sup>t</sup> with recently reported temperature sensors, and the proposed trimming technique can be used in multiple presented applications.

**Author Contributions:** Conceptualization, A.M.V., A.N., and A.T.; methodology, A.M.V. and A.N.; software, A.M.V. and A.N.; validation, A.N., A.T., and G.B.; formal analysis, A.M.V.; investigation, A.M.V. and A.N.; resources, A.M.V. and A.T.; data curation, A.M.V.; writing—original draft preparation, A.M.V.; writing—review and editing, A.N.; visualization, A.T. and G.B.; supervision, A.T. and G.B. All authors have read and agreed to the published version of the manuscript.

**Funding:** This research received no external funding.

**Institutional Review Board Statement:** Not applicable.

**Informed Consent Statement:** Not applicable.

**Data Availability Statement:** Data sharing not applicable.

**Conflicts of Interest:** The authors declare no conflict of interest.
