*2.2. Optical and Scanning Electron Microscope, Energy-Dispersive X-ray Spectroscopy*

The optical microscope used was a Mitutoyo WF with a ZEISS Axiocam 1Cc5 color Charge Coupling Device (CCD) camera. The magnifications available were 5×, 10×, 20× and 100×. The Dzi bead was affixed to the glass of the stage with a sticky carbon tab to ensure its stability. The scanning electron microscope was a LEO/ZEISS 1540XB instrument. Both the optical and SEM measurements were made in Western's Nanofabrication Facility. Images were collected from a piece of the Dzi bead, specifically on the outer surface of the bead. Special attention was paid to the etched rings on the surface. The Energy Dispersive X-ray (EDX) detector model was the N-Max 50 by Oxford Instruments. This detector was coupled to the SEM, and the emitted fluorescent X-rays from the sample surface were collected to perform a complete elemental analysis on specific sections on the Dzi bead surface.
