**Cher Ming Tan**

Cher Ming Tan, Professor received his Ph.D. in Electrical Engineering from the University of Toronto in 1992. He worked in the reliability field in the electronic industry before joining Nanyang Technological University as a faculty member (1996–2014). He joined Chang Gung University, Taiwan and set up a research Center on Reliability Sciences and Technologies in Taiwan and acts as Center Director. He is a Professor in the Electronic Department of Chang Gung University and Honorary Chair Professor at Ming Chi University of Technology, Taiwan. He has published 350+ international journal and conference papers and given many keynotes, talks and tutorials at international conferences. He has written more than seven books and chapters in the field of reliability. He is an Editor of five international reputed journals. He is on the committee of IEEE EDS Reliability Physics. He is a past chair of IEEE Singapore Section, senior member of IEEE and ASQ, and Distinguished Lecturer of IEEE Electronic Device Society on reliability. He was the first individual recipient of the Ishikawa-Kano Quality Award in Singapore in 2014. He is also listed in the top 2% of scientists in the world by Stanford University.
