*2.6. Compatibility Layer Quantitative Characterization Test*

The 1000-times backscattered electron images obtained by the scanning electron microscope test were cut by one-eighth according to the method shown in Figure 1 (image pixel: 3840 × 2160 dpi), and then the obtained images were printed on photo paper by a highdefinition printer. The pixel dimensions of the printer were 1200 × 1200 dpi, and the size of the photo paper was 420 × 297 mm. Finally, according to the method shown in Figure 2, the light passage of the colorimeter was oriented and shifted quantitatively to determine the size of the compatibility layer between the MVSR phase and the SEBS/SBS phase.

**Figure 1.** Printing method of BSE diagrams.

**Figure 2.** The test method for the colorimeter to test the size of the compatibility layer in TPSiV.
