*2.5. Scanning Electron Microscopy*

The microcapsules and GCPPE were analyzed by scanning electron microscopy (SEM) using the JSM 6380 LV system (JEOL Techniques Ltd., Tokyo, Japan). The microscope was operated at 20 kV accelerating voltage. The samples were coated with a gold layer of about 150 Å in thickness, using an Edwards S 150 sputter coater (Agar Scientific, Standsted, UK) [21].
