*2.4. Conductive Atomic Force Microscopy (C-AFM) Measurements*

Local current-voltage and current phase diagram measurements were performed by C-AFM using with Au- and diamond-coated Si cantilever tips (FM-LC, 100 kHz, and 8 N/m). *I*–*V* curves were collected perpendicular to the CIPS samples in C-AFM mode.
