*2.4. Morphological and Elemental Analysis*

The study of the surface morphology was carried out with a scanning electron microscope (SEM) "EVO 50 XVP" (Carl Zeiss, Jena, Germany) with a probe microanalysis system "INCA Energy—350" (Oxford Instruments, Abingdon, UK). Roughness parameters were

determined using a TR-200 profilometer (TIME GROUP Inc., Beijing, China). According to the curves of the surface profilograms, the values of the roughness parameters were calculated: Ra is the mean deviation of the profile; Rq is the mean square deviation of the profile. As a result of the research, it was found that the total error is less than 5%.
