*3.5. Catalyst Characterization*

Powder X-ray diffraction analysis was performed using a Rigaku Smartlab X-ray Diffractometer (Austin, TX, USA) using a Cu\_Kα source and collected between 20 and 80 2Θ. The XPS measurements were performed using a Thermo Scientific K-alpha equipped with a monochromatic Al Kα source and 180◦ double focusing hemispherical analyzer with 128-channel detector was used to collect X-ray photoelectron spectroscopy data. The nominal XPS spot size and analyzer field of view were 100 μm2. Charge compensation was necessary.
