*2.5. Powder X-ray Di*ff*raction (PXRD)*

PXRD measurements of the new compounds were carried out on a Rigaku-Ultima IV X-ray powder diffractometer (Tokyo, Japan) using Cu Kα radiation (λ = 1.54178 Å) at 40 kV and 40 mA. Samples were analysed in the 2θ range from 5◦ to 80◦ with a scanning rate of 8◦ /min. These data were collected at room temperature and analysed using Jade 6.0 software (Livermore, CA, USA).
