*2.3. Powder X-ray Diffraction (PXRD)*

PXRD was performed using SmartLab (Rigaku, Japan) in the manner of transmission geometry. The data were collected from 2*θ* = 3◦ to 40◦ at an ambient temperature at step and scan speeds of 0.01◦ and 3◦min−<sup>1</sup> , respectively, using a Cu Kα source (45 kV, 200 mA). The conditions for simultaneous PXRD and DSC measurements are discussed in Section 2.6.
