*2.4. PXRD*

The PXRD patterns of the DPA:TA samples were measured in the reflectance mode using a SmartLab diffractometer (Cu Kα source (40 kV and 200 mA), D/teX ultra-highspeed position-sensitive detector, Rigaku, Tokyo, Japan). Diffraction patterns (2θ) were collected from 5◦ to 40◦ at 25◦C with a step of 0.01◦ and a scan speed of 20◦/min.
