*3.5. Powder X-ray Di*ff*raction*

X-ray powder diffraction (XRPD) data were collected at room temperature using copper Kα radiation on a PANalytical X'Pert Pro powder diffractometer model PW3050/60 (PANalytical, Almelo, The Netherland) in Bragg-Brentano geometry equipped with a X'celerator detector. The sample was prepared by mounting a sample on a wafer (zero background) plate and scanned from 3 to 40◦ 2θ using the following acquisition parameters: generator tension 45 kV, generator current 40 mA, step size 0.0167◦ , scan speed 0.011◦ /second, number of steps 2214 and total collection time 60 min, scan speed 0.05◦ /second, number of steps 2214 and total collection time 13 min.
