*2.4. Powder X-ray Diffraction (PXRD)*

The PXRD patterns of all samples were measured in the reflectance mode using a SmartLab diffractometer (Cu Kα source (40 kV and 200 mA), D/teX ultra-high-speed position-sensitive detector, Rigaku). Diffraction patterns (2θ) were collected from 5◦ to 40◦ at 25 ◦C with a step of 0.01◦ and a scan speed of 20◦/min.
