*2.4. Powder X-ray Diffraction*

PXRD patterns were measured on a Bruker D8 Advance Series II Vario diffractometer (Bruker, AXS, Karlsruhe, Germany) using Cu-Kα<sup>1</sup> radiation (λ = 1.5406 Å) at 40 kV and 40 mA. Diffraction patterns were collected over 2θ range of 5–60◦ and using a continuous step size of 0.02◦ and a total acquisition time of 1 h. The software used for data analysis was Diffrac.EVA v5.0 and TOPAS v6.0 (Bruker, AXS, Karlsruhe, Germany).
