**Powder X-ray Diffraction (PXRD) Analysis**

X-ray diffraction patterns can be used as one of the confirmatory tools for the detection of the formation of a eutectic system. Figure 2 displays the comparison between the PXRD patterns obtained for starting components and their respective eutectic systems.

**Figure 2.** Overlay of PXRD patterns of (**a**) AMG, CAF and the eutectic mixture of the AMG-CAF system, (**b**) AMG, NIC and the eutectic mixture of the AMG-NIC system and (**c**) AMG, ZMD and the eutectic mixture of the AMG-AMD system. Main characteristic peaks are indicated by dashes lines.

In a eutectic system, the retention of the crystal structure of individual components is expected, consequently, the PXRD pattern of the eutectic system should contain the overlap of diffraction peaks of starting components without the generation of new diffraction peaks. As seen in the comparison of the diffraction patterns of the eutectic mixtures and the pure starting components, no new peaks were observed and all the diffraction peaks of the starting components are present in the grinded mixtures, signifying the formation of eutectic mixtures in all three studied cases.
