*2.4. X-ray Powder Diffraction (XRPD)*

The crystalline state of samples was investigated by X-ray powder diffraction (XRPD) with an Emyrean Panalytical (UK) V 2.0 instrument equipped with Cu radiation source. Samples were placed on zero background sample holders. The measurements were performed in reflection mode with 2Theta scans from 1.5 to 45◦, step size 0.02◦, soller slit 0.02 rad, divergence slit 1/8◦, antiscatter slit 1/4◦. The variable temperature and humidity XRPD analyses were carried out with an Anton Paar (Austria) CHC+ camera equipped with CCU100 temperature control and an MHG-32 humidity generator. The measurements were performed in reflection mode, 2Theta scan from 1.5 to 45◦, step size 0.02◦, soller slit 0.02 rad, divergence slit 1/8◦, antiscatter slit 1/4◦.
