*2.4. Analytical Techniques*

**Powder X-ray Diffraction (PXRD)**. The solid-state properties of the system were investigated by powder X-ray diffraction (PXRD) analysis with an X'pert Pro Diffractometer (PANalytical GmbH, Kassel, Germany) with Cu Kα radiation and an X'Celerator detector in the 2-theta range of 3–40◦ with a step size of 0.017◦ and a step time of 50 s.

**Differential Scanning Calorimetry**. Thermal analysis was carried out using a DSC 131 (Setaram, Diepholz, Germany), which was regularly calibrated using highly-pure standard materials. The DSC measurements were carried out in aluminum crucibles with a constant heating rate of 2 K/min, under a pure helium atmosphere at 8 mL/min.

**Fourier Transform Infrared Spectroscopy (FT-IR)**. A Bruker ALPHA II FT-IR (Bruker, Karlsruhe, Germany) with a diamond attenuated total reflectance (ATR) accessory was used to gather Fourier transform infrared spectra. The solid materials were placed in the ATR cell without further preparation and investigated in the 4000–400 cm−<sup>1</sup> range, collecting 32 scans at a resolution of 2 cm<sup>−</sup>1.

**Scanning Electron Microscopy**. Scanning electron microscopy (SEM) was carried out by using a Carl Zeiss Microscopy Ltd. (Jena, Germany) instrument at an acceleration voltage of 10 keV.

**Hot Stage Microscopy**. Hot Stage Microscopy was carried out using a Linkam hot stage LTS420 (Linkam Scientific Instruments Ltd., Waterfield, UK) with an Axioskop 2 microscope (Carl Zeiss, Oberkochen, Germany). Images were recorded and analyzed using Axiovision 2 software.
