3.3.5. Sensitivity

One of the essential characteristics of TLD properties is dosimeter sensitivity TL. Sensitivity is defined as the TL intensity per unit mass of the thin film and per unit dose of X-ray radiation (TL.mGy−1.mg−1), as shown in Equation (4).

$$S(D) = TL/m.D\tag{4}$$

where *TL* is the intensity (expressed in nC), and *m.D* is the dose (expressed in mGy).

Relative sensitivity, another term linked to the dosimeter material sensitivity, is often compared to the standard (TLD 100). The following equation expresses relative sensitivity [78].

$$R(D) = \ S(D)\_{material} / \mathcal{S}(D)\_{TLD\ 100} \tag{5}$$

The sensitivity could be obtained based on the slope of the graph of response doses (linearity) [79]. The sensitivity of 0.5 mol% Ag-doped ZnO appeared to be approximately two times that of the TLD 100 chips, which agreed with the past reported studies.
