3.3.4. Dose-Response

The study investigated the TL response for the Ag-doped ZnO thin films. Each data point involved three samples; the average and standard deviations were taken. Figure 13 shows the linear response doses (0.1–4 Gy) for Ag-doped ZnO thin films. The study revealed an excellent linear response and correlation coefficients of 0.97 and 0.996 for Ag-doped ZnO thin films and TLD 100 chips, respectively. The results indicated the distribution of deep traps in Ag-doped (0.5 mol%) ZnO thin films located at different levels [76]. The Ag-doped ZnO thin films and TLD 100 chips were irradiated under the same condition for comparison (to the material host). The response of TLD 100 chips appeared linear within the range (0.1–4 Gy), as expected. This finding confirmed that the phosphorus established deep traps within the nanocomposites lattice, which is proportional to the various doses [77].

**Figure 13.** The linearity of response dose irradiated with X-ray (0.1–4) Gy.
