**3. Experiment and Discussions**

A die micrograph of the designed detector (DUT 1) and a device with only a PTAT sensor (DUT 2) is shown in Figure 5. DUT 1 and DUT 2 occupy chip areas of 164 μm × 214 μm and 141 μm × 193 μm, respectively. Various figures of merit, such as responsivity, noise equivalent power (NEP), and thermal time constant, are adopted to evaluate the performances of detectors.

**Figure 5.** Die micrograph of thermal detectors.
