*3.1. Measurement Process Variability, up*

Table 1 lists the results obtained for the (*up*) uncertainty contribution. The result comprises every uncertainty component that falls within the measurement process variability, such as the instrument repeatability itself, MBD data processing strategy, or any potential thermal drift, among other minor contributors. Table 1 also considers the obtained mean value for every measured GD&T for further (*ub*) uncertainty contributor assessment.


**Table 1.** (*up*) uncertainty contributor assessment according to ISO 15530-3 technical specification.

For every GD&T element, the highest measurement process variability (*up*) results were below 20 μm whereas the average standard deviation was less than 10 μm. These results demonstrate that the measurement process, from the data acquisition process and 3D point cloud reconstruction to the MBD-based data processing procedure, is within the micrometre accuracy.
