**6. Conclusions and Scope for Future Work**

The optimal location(s) and size(s) of distributed generations derived for three cases ensure an enhancement in the electrical loss minimization and also, improves the bus voltage profile when compared to a system without distributed generations. While analyzing all the cases, it is observed that Case 3 has provided the best result. It was observed that the APL value is reduced at UPF by 0.00003 MW, 0.014472 MW, and 0.021307 MW for Case 1, Case 2, and Case 3, respectively when compared to [77]. The minimum value of bus voltage is improved by 6.42% for Case 3 at UPF when compared to No DG Case. The bus voltage profile was further improved at 0.85 and 0.82 power factors by 7.71% and 7.78%, respectively. After achieving the acceptable results, the reliability analysis is performed for the distributed generation integrated distribution system. It is concluded that the combination of Case 3 with Scenario 6 provides the best system's reliability results. However, Scenario 6 being an ideal one, Case 3 with Scenario 1 is considered to yield better results for the improvement in the system's reliability. This research

analysis can be extended in the future for a greater number of standard distribution systems considering the following aspects.


The future aspects can be dealt with large radial distribution systems, including IEEE 69 and 118 bus systems. Inclusion of reliability data in terms of electrical, mechanical, and structural subsystems which would be favorable in obtaining accurate reliability of the system. Distribution system reliability improvement can also be achieved by adjusting the number of branches which is termed as a system reconfiguration technique. Furthermore, the dependency of reliability analysis on CO2 emission, economics, system protection, and system security can also be considered for further research works.

**Author Contributions:** Conceptualization, Methodology, and Draft writing: S.K.; Software Implementation and Review: K.S.; Mathematical formulations: A.S.S.V.; Investigation, Results validation, and Data curation: R.M.E.; Supervision, Results validation, and Review: R.K.S.; Review and Editing: N.D. All authors have read and agreed to the published version of the manuscript.

**Funding:** This research received no external funding.

**Acknowledgments:** The authors wholeheartedly thank the Department of Electrical Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi for providing the laboratory facilities and technical support to accomplish the research work promptly. The first author expresses his gratitude towards Govind Ballabh Pant Institute of Engineering and Technology, Pauri Garhwal, Uttarakhand, India for allowing him to pursue PhD from IIT(BHU) Varanasi, Uttar Pradesh, India.

**Conflicts of Interest:** The authors declare no conflict of interest.
