*3.2. Characterization*

The sample was determined using powder X-ray diffraction (Bruker AXS, D8 advance, Germany) with CuKα radiation (λ = 1.54 Å) and was collected in 2θ range from 10◦ to 90◦. The X-ray photoelectron spectroscopy (XPS) was carried out to determine the surface electronic state of the samples with a monochromatized Al Kα radiation source (AXIS Ultra DLD, Japan). The Raman spectra were recorded using Raman microscope at laser wavelength of 785 nm (Horiba, XploRA Plus, France). The electron paramagnetic resonance (EPR) signals of free radicals were recorded at ambient temperature (Bruker; Elexsys 500, Germany). The morphologies and elemental composites of the samples were examined by a scanning electron microscope (JEOL, JSM-IT500, Japan) and Field emission scanning electron microscope (FE-SEM, JEOL, JSM-7610FPlus, Japan). Photoluminescence (PL) spectrum was performed with excitation at 320 nm (Horiba, FluoroMax, France). The band gap energy of the prepared samples was carried out by UV-Vis NIR spectrophotometer (Shimadzu, UV3600 plus, Tokyo, Japan). The degradation of IMI was monitored by measuring the absorbance at 268 nm with a UV-Vis spectrophotometer (Perkin Elmer, Lambda 800, MA, USA).
