**5. Conclusions**


dispersive X-ray spectral microanalysis and elementary mapping showed the presence of impurity rubidium atoms in modified silicon crystals.


**Author Contributions:** Supervision, A.P.R.; writing—original draft preparation, A.D.S. and I.A.P.; writing—review and editing, A.D.S., I.A.P. and V.V.T.; investigations, A.D.S., I.A.P., E.V.M. and A.P.R. All authors have read and agreed to the published version of the manuscript.

**Funding:** This work was carried out within the framework of the state task (Theme No. 122011200363-9).

**Data Availability Statement:** Data presented in this article are available at request from the corresponding author.

**Conflicts of Interest:** The authors declare no conflict of interest.
