2.2.3. Scanning Electron Microscope with Energy Dispersive Spectroscopy (SEM-EDS)

The morphology of the filters was investigated using a scanning electron microscope ULTRA PLUS (ZEISS, Oberkochen, Germany). The quantitative X-ray microanalysis of the materials was performed by the energy-dispersive spectrometry method using an X-ray spectrometer (Quantax 400, Bruker, Billerica, MA, USA).
