*3.1. General*

Unless otherwise noted, all reactions were performed under an argon atmosphere, and all reagents and solvents were used as received without further purification. Column chromatography was performed on *Fuji silysia* Chromatorex 60B silica gel. Melting points (mp) were measured with a *Yanako* Micro Melting Point Apparatus MP-J3 and reported without correction. Infrared (IR) spectra were recorded on a *Shimadzu* IRAffinity-1 spectrometer and expressed as frequency of absorption (cm−1). Optical rotations were measured with *JASCO* DIP-1000 or P-2200 spectrometers. 1H and 13C{1H} NMR spectra (Supplementary Materials) were recorded on *JEOL* JNM-AL400, JNM-ECZ400R (400 MHz for 1H NMR, 100 MHz for 13C{1H} NMR) or *Varian* NMR System 500PS SN (125 MHz for 13C{1H} NMR) spectrometers. Chemical shift values are expressed in parts per million (ppm) relative to internal TMS (*<sup>δ</sup>* 0.00 ppm for 1H NMR) or deuterated solvent peaks (*<sup>δ</sup>* 77.0 ppm (CDCl3) for 13C{1H} NMR). Abbreviations are as follows: s, singlet; d, doublet; t, triplet; q, quartet; m, multiplet; br, broad; app, apparent. Enantiomeric excess values were determined by chiral high-performance liquid chromatography (HPLC) analysis using *DAICEL* CHIRALPAK AD or AY-H columns. HPLC chromatograms (Supplementary Materials) were recorded on a CR8A CHROMATOPAC with an LC-20AT pump and SPD-20A UV detector (*Shimadzu*). High-resolution mass spectra (HRMS) were obtained on a *JEOL* JMS-700N (double-focusing

magnetic sector mass analyzer) spectrometer with either the electron impact ionization (EI) or the fast atom bombardment (FAB) methods or a *JEOL* JMS-T100TD (TOF mass analyzer) spectrometer with either the direct analysis in real-time (DART) or the electrospray ionization (ESI) method.
