*2.9. Elemental Analysis of Strawberry Fruit EDX Analysis*

Elemental analysis of strawberry fruits was performed by scanning electron microscopy (SEM), attached with energy dispersive spectrometry (EDX), and a JFC-1100E ion sputtering device (model JEOL/MP, JSMIT200 Series, Tokyo, Japan) with an acceleration voltage of 20.00 kV (SEM–EDX) [55] to measure the changes in the elemental chemical composition of strawberry fruits due to different treatments.
