*2.5. Microstructure Analysis*

Finally, Scanning Electron Microscopy (SEM) analysis was performed in order to see the microstructure evolution of the material for different burnishing, using an EVO HD15 by ZEISS (Zeiss and Quorum technologies, Oberkochen, Germany) equipped with an energy-dispersive X-ray spectrometer (SEM-EDX). Typical working parameters were an accelerating voltage of 15 kV and a working distance of 10 mm.
